Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11275104 | Test apparatus | Takeshi Yaguchi, Kazushige Yamamoto, Shintaro Ichikai | 2022-03-15 |
| 7444576 | Target value search circuit, taget value search method, and semiconductor test device using the same | — | 2008-10-28 |
| 7330045 | Semiconductor test apparatus | — | 2008-02-12 |
| 7196534 | Semiconductor test instrument | — | 2007-03-27 |
| 7187192 | Semiconductor test device having clock recovery circuit | Yasutaka Tsuruki | 2007-03-06 |
| 7078889 | Semiconductor test apparatus for testing semiconductor device that produces output data by its internal clock timing | — | 2006-07-18 |
| 6956395 | Tester for testing an electronic device using oscillator and frequency divider | Yasutaka Tsuruki | 2005-10-18 |