YF

Yasuo Furukawa

AD Advantest: 41 patents #6 of 1,193Top 1%
Fujitsu Limited: 3 patents #8,614 of 24,456Top 40%
HH Hirakawa Hewtech: 2 patents #2 of 16Top 15%
TT The University Of Tokyo: 2 patents #500 of 2,633Top 20%
TK Takeda Riken Kogyo Kabushikikaisha: 1 patents #24 of 49Top 50%
TC Toho Rayon Co.: 1 patents #21 of 61Top 35%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
KC Kokusai Denshin Denwa Co.: 1 patents #219 of 382Top 60%
NE Nec: 1 patents #7,889 of 14,502Top 55%
SC Shin-Etsu Chemical Co.: 1 patents #1,340 of 2,176Top 65%
📍 Tokyo, CA: #168 of 583 inventorsTop 30%
Overall (All Time): #56,606 of 4,157,543Top 2%
49
Patents All Time

Issued Patents All Time

Showing 1–25 of 49 patents

Patent #TitleCo-InventorsDate
10243408 Wireless power receiver Yuki Endo 2019-03-26
9966798 Wireless power receiver Yuki Endo 2018-05-08
9893534 Relay device of wireless power transmission system Yuki Endo 2018-02-13
9882550 Wireless power transmitting apparatus and wireless power supply system Yuki Endo 2018-01-30
9871413 Wireless power receiving apparatus Yuki Endo 2018-01-16
9742201 Wireless power receiving apparatus Yuki Endo 2017-08-22
9640317 Wireless power transmitter and wireless power receiver Yuki Endo 2017-05-02
9633782 Wireless power transmitter Yuki Endo 2017-04-25
9589721 Wireless power transmitter and wireless power receiver Yuki Endo 2017-03-07
9552921 Wireless power transmitter and wireless power receiver Yuki Endo 2017-01-24
9329215 Impedance measurement apparatus Yuki Endo, Tomoaki Ueda 2016-05-03
9071063 Wireless power receiving apparatus Yuki Endo 2015-06-30
8909966 Wireless power supply apparatus Yuki Endo 2014-12-09
8791601 Wireless power receiving apparatus and wireless power supply system 2014-07-29
8536887 Probe circuit, multi-probe circuit, test apparatus, and electric device 2013-09-17
8525714 Test apparatus and test method for A/D converter Koji Asami 2013-09-03
8195411 IDDQ test apparatus and test method Shoji Kojima 2012-06-05
8185336 Test apparatus, test method, program, and recording medium reducing the influence of variations Goerschwin Fey, Satoshi Komatsu, Masahiro Fujita 2012-05-22
7984353 Test apparatus, test vector generate unit, test method, program, and recording medium Gorschwin Fey, Satoshi Komatsu, Masahiro Fujita 2011-07-19
7948256 Measurement apparatus, test system, and measurement method for measuring a characteristic of a device 2011-05-24
7859288 Test apparatus and test method for testing a device based on quiescent current 2010-12-28
7548076 Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses Mitsunori Satou 2009-06-16
7463018 Carrier module for adapting non-standard instrument cards to test systems Eric Barr Kushnick, Lawrence Kraus, James Getchell 2008-12-09
7395480 Test apparatus and test method 2008-07-01
7362089 Carrier module for adapting non-standard instrument cards to test systems Eric Barr Kushnick, Lawrence Kraus, James Getchell 2008-04-22