Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429440 | Wafer measurement system using time-of-flight medium-energy ion scattering signal | Yu-Chiang Pao, Yuh-Yih Lu, Kyu-Sang Yoo, Soo-Bang Kim | 2025-09-30 |
| 11813601 | Thermal cracking system | — | 2023-11-14 |