Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429440 | Wafer measurement system using time-of-flight medium-energy ion scattering signal | Yu-Chiang Pao, Yao-Yu Chang, Yuh-Yih Lu, Kyu-Sang Yoo | 2025-09-30 |
| 8445357 | Method of fabricating semiconductor integrated circuit device and semiconductor integrated circuit device fabricated using the method | Yong-Don Kim, Eung-Kyu Lee, Sung-Ryoul Bae, Dong-Eun Jang | 2013-05-21 |