Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099025 | Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection | Lin Zheng, Shitao Dou, Xin Chen, Lunwu ZHANG, Jin Zhang +6 more | 2024-09-24 |
| 11846595 | Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece | Lin Zheng, Shitao Dou, Changguang He, Zhengkun Peng, Yong Xiao +2 more | 2023-12-19 |