Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11846595 | Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece | Lin Zheng, Shitao Dou, Changguang He, Yong Xiao, Lunwu ZHANG +2 more | 2023-12-19 |
| 7583788 | Measuring device for the shortwavelength x ray diffraction and a method thereof | Lin Zheng, Changguang He | 2009-09-01 |