Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6794889 | Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing | Nasser Jafari, Kenneth D. Karklin | 2004-09-21 |
| 6129476 | Breakaway precision robot end effector | Russell Berman, Carl Robert Mendel | 2000-10-10 |