Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10824081 | Metrology method for a semiconductor manufacturing process | Christopher P. Ausschnitt | 2020-11-03 |
| 10656535 | Metrology method for a semiconductor manufacturing process | Christopher P. Ausschnitt | 2020-05-19 |
| 10481504 | Method and apparatus for semiconductor manufacturing | Christopher P. Ausschnitt | 2019-11-19 |
| 9874821 | Method for hotspot detection and ranking of a lithographic mask | Sandip Halder, Dieter Van Den Heuvel, Philippe Leray | 2018-01-23 |