Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D1090440 | Spring probe contact assembly | — | 2025-08-26 |
| D1074619 | Spring pin tip | — | 2025-05-13 |
| D1044751 | Compliant ground block and testing system for testing integrated circuits | Pat Joyal, Leslie Fliegelman | 2024-10-01 |
| 11906576 | Contact assembly array and testing system having contact assembly array | Max Carideo, David Skodje, Melissa Hasskamp | 2024-02-20 |
| D1015282 | Spring pin tip | — | 2024-02-20 |
| 11867752 | Contact assembly and kelvin testing system having contact assembly | Max Carideo, David Skodje, Melissa Hasskamp | 2024-01-09 |
| 11821943 | Compliant ground block and testing system having compliant ground block | Pat Joyal, Leslie Fliegelman, Max Carideo | 2023-11-21 |
| 11268981 | Spring-loaded probe having folded portions and probe assembly | James Brandes, Travis Evans | 2022-03-08 |
| 11088051 | Test socket assembly and related methods | Mitchell Nelson, Jason Mroczkowski | 2021-08-10 |
| 11041881 | Hybrid probe head assembly for testing a wafer device under test | Mitchell Nelson | 2021-06-22 |
| 10101360 | Link socket sliding mount with preload | Aaron Magnuson, Sergey Yakushev, Dan Sikorski | 2018-10-16 |
| 10037933 | Test socket assembly and related methods | Mitchell Nelson, Jason Mroczkowski | 2018-07-31 |
| 9829506 | Test probe assembly and related methods | Aaron Magnuson, Sergey Yakushev, Scott Hanson | 2017-11-28 |
| 8523579 | Spring contact assembly | Charles J. Johnston, Scott Chabineau, Sergey Yakushev, Mark A. Swart, Edward A. Kottmeyer | 2013-09-03 |
| 8231416 | Spring contact assembly | Charles J. Johnston, Scott Chabineau, Sergey Yakushev, Mark A. Swart, Edward A. Kottmeyer | 2012-07-31 |
| 7862391 | Spring contact assembly | Charles J. Johnston, Scott Chabineau, Sergey Yakushev, Mark A. Swart, Edward A. Kottmeyer | 2011-01-04 |
| 7256593 | Electrical contact probe with compliant internal interconnect | — | 2007-08-14 |
| 7173442 | Integrated printed circuit board and test contactor for high speed semiconductor testing | Jason Mroczkowski | 2007-02-06 |
| 6217341 | Integrated circuit test socket having torsion wire contacts | Michael S. Glick | 2001-04-17 |
| 6162080 | Socket for positioning and installing an integrated circuit on a circuit board | Michael S. Glick, Kevin L. Young | 2000-12-19 |
| 6045370 | Test socket for electronic module | Craig J. Reske | 2000-04-04 |
| 5990693 | Test contactor | William J. Hayes, Jamie Black Doehrmann | 1999-11-23 |