Issued Patents All Time
Showing 1–25 of 34 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8523579 | Spring contact assembly | Scott Chabineau, Valts Treibergs, Sergey Yakushev, Mark A. Swart, Edward A. Kottmeyer | 2013-09-03 |
| 8231416 | Spring contact assembly | Scott Chabineau, Valts Treibergs, Sergey Yakushev, Mark A. Swart, Edward A. Kottmeyer | 2012-07-31 |
| 8105119 | Flat plunger round barrel test probe | Mark A. Swart, Steve B. Sargeant | 2012-01-31 |
| 7862391 | Spring contact assembly | Scott Chabineau, Valts Treibergs, Sergey Yakushev, Mark A. Swart, Edward A. Kottmeyer | 2011-01-04 |
| 6462567 | Self-retained spring probe | Gordon A. Vinther, Scott Chabineau, Brian L. Crisp | 2002-10-08 |
| 6414504 | Coaxial tilt pin fixture for testing high frequency circuit boards | — | 2002-07-02 |
| 6396293 | Self-closing spring probe | Gordon A. Vinther, Scott Chabineau | 2002-05-28 |
| 6271672 | Biased BGA contactor probe tip | Mark A. Swart, Gordon A. Vinther | 2001-08-07 |
| 6204680 | Test socket | Mark A. Swart, Gordon A. Vinther, Steve B. Sargeant, Roy W. Green | 2001-03-20 |
| 6084421 | Test socket | Mark A. Swart, Gordon A. Vinther, Steve B. Sargeant | 2000-07-04 |
| D422230 | Coaxial test probe | — | 2000-04-04 |
| 5865641 | Solid spring electrical contacts for electrical connectors and probes | Mark A. Swart | 1999-02-02 |
| D400811 | Test probe plunger tip | Mark A. Swart, Gordon A. Vinther | 1998-11-10 |
| 5781023 | Hollow plunger test probe | Mark A. Swart, Gordon A. Vinther, Byron C. Sanderson | 1998-07-14 |
| D395016 | Coaxial test probe with quadrature ground provision | Robert R. Kornowski, Damian Santay | 1998-06-09 |
| 5667410 | One-piece compliant probe | — | 1997-09-16 |
| 5663655 | ESD protection for universal grid type test fixtures | Mark A. Swart, Patrick R. Gocha | 1997-09-02 |
| 5557211 | Vacuum test fixture for printed circuit boards | Mary E. Ferrer, Gary F. St. Onge, Mark A. Swart | 1996-09-17 |
| 5444387 | Test module hanger for test fixtures | David R. Van Loan, Mark A. Swart | 1995-08-22 |
| 5422575 | Test fixture with adjustable bearings and optical alignment system | Mary E. Ferrer, Gary F. St. Onge, Mark A. Swart | 1995-06-06 |
| 5408189 | Test fixture alignment system for printed circuit boards | Mark A. Swart, David R. Van Loan | 1995-04-18 |
| 5391995 | Twisting electrical test probe with controlled pointing accuracy | Mark A. Swart | 1995-02-21 |
| 5321351 | Test fixture alignment system | Mark A. Swart, David R. Van Loan | 1994-06-14 |
| 5300881 | Test fixture | Mary E. Ferrer, Gary F. St. Onge, Mark A. Swart | 1994-04-05 |
| 5289117 | Testing of integrated circuit devices on loaded printed circuit | David R. Van Loan, Mark A. Swart | 1994-02-22 |