VP

Vadim Pinskiy

NI Nanotronics Imaging: 49 patents #3 of 43Top 7%
Overall (All Time): #55,156 of 4,157,543Top 2%
49
Patents All Time

Issued Patents All Time

Showing 25 most recent of 49 patents

Patent #TitleCo-InventorsDate
12346088 Systems, methods, and media for manufacturing processes Matthew C. Putman, Damas Limoge, Sadegh Nouri Gooshki, Aswin Raghav Nirmaleswaran, Fabian Hough 2025-07-01
12298489 Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel Matthew C. Putman, John B. Putman, Denis Sharoukhov 2025-05-13
12205360 Defect detection system Tonislav Ivanov, Denis Babeshko, Matthew C. Putman, Andrew Sundstrom 2025-01-21
12165353 Systems, methods, and media for manufacturing processes Matthew C. Putman, Andrew Sundstrom, Aswin Raghav Nirmaleswaran, Eun-Sol Kim 2024-12-10
12153412 Predictive process control for a manufacturing process Matthew C. Putman, John B. Putman, Damas Limoge 2024-11-26
12153401 Systems, methods, and media for manufacturing processes Andrew Sundstrom, Damas Limoge, Eun-Sol Kim, Matthew C. Putman 2024-11-26
12153408 Systems, methods, and media for manufacturing processes Andrew Sundstrom, Eun-Sol Kim, Damas Limoge, Matthew C. Putman 2024-11-26
12153411 Predictive process control for a manufacturing process Matthew C. Putman, John B. Putman, Damas Limoge 2024-11-26
12153414 Imitation learning in a manufacturing environment Matthew C. Putman, Andrew Sundstrom, Damas Limoge, Aswin Raghav Nirmaleswaran, Eun-Sol Kim 2024-11-26
12153668 Securing industrial production from sophisticated attacks Matthew C. Putman, Damas Limoge, Andrew Sundstrom 2024-11-26
12155673 Dynamic monitoring and securing of factory processes, equipment and automated systems Matthew C. Putman, John B. Putman, Damas Limoge, Andrew Sundstrom, James Williams, III 2024-11-26
12140926 Assembly error correction for assembly lines Matthew C. Putman, Eun-Sol Kim, Andrew Sundstrom 2024-11-12
12111922 Method, systems and apparatus for intelligently emulating factory control systems and simulating response data Matthew C. Putman, John B. Putman, Andrew Sundstrom, James Williams, III 2024-10-08
12111923 Dynamic monitoring and securing of factory processes, equipment and automated systems Matthew C. Putman, John B. Putman, Damas Limoge, Andrew Sundstrom, James Williams, III 2024-10-08
11948270 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging Matthew C. Putman, John B. Putman, Joseph Succar 2024-04-02
11889797 Controlled growth system for biologicals Damas Limoge, Parker Musselman 2024-02-06
11796785 Systems, devices and methods for automatic microscope focus John B. Putman, Matthew C. Putman, Denis Sharoukhov 2023-10-24
11748846 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging Matthew C. Putman, John B. Putman, Joseph Succar 2023-09-05
11731368 Systems, methods, and media for artificial intelligence process control in additive manufacturing Matthew C. Putman, Damas Limoge, Aswin Raghav Nirmaleswaran 2023-08-22
11709483 Predictive process control for a manufacturing process Matthew C. Putman, John B. Putman, Damas Limoge 2023-07-25
11703824 Assembly error correction for assembly lines Matthew C. Putman, Eun-Sol Kim, Andrew Sundstrom 2023-07-18
11693956 Dynamic monitoring and securing of factory processes, equipment and automated systems Matthew C. Putman, John B. Putman, Damas Limoge, Andrew Sundstrom, James Williams, III 2023-07-04
11675330 System and method for improving assembly line processes Matthew C. Putman, Eun-Sol Kim, Andrew Sundstrom 2023-06-13
11669078 Predictive process control for a manufacturing process Matthew C. Putman, John B. Putman, Damas Limoge 2023-06-06
11662563 Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel Matthew C. Putman, John B. Putman, Denis Sharoukhov 2023-05-30