Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10612917 | Control method of surface texture measuring apparatus | Tetsuya Koga | 2020-04-07 |
| 10521923 | Part program generating device of surface texture measuring apparatus | Tetsuya Koga | 2019-12-31 |
| 9151588 | Method of measuring a circular shape characteristic and circular shape characteristic measuring device and program | Junji Sakurada | 2015-10-06 |
| 8538165 | Image measuring apparatus, program, and teaching method of image measuring apparatus | Kozo Ariga, Jyota Miyakura | 2013-09-17 |
| 8364441 | Surface texture measuring device, surface texture measuring method, and program | — | 2013-01-29 |
| 8196457 | Surface texture measuring device, surface texture measuring method and surface texture measuring program | Hiroyuki Hidaka | 2012-06-12 |
| 7636646 | Roundness measuring device, method and program for measuring roundness | — | 2009-12-22 |
| 7542872 | Form measuring instrument, form measuring method and form measuring program | Soichi Kadowaki, Tomonori Goto | 2009-06-02 |
| 7036238 | Width-measuring method and surface texture measuring instrument | Junji Sakurada, Toshiyuki Tamai, Sadayuki Matsumiya, Takafumi Kano, Kazushi Noguchi | 2006-05-02 |
| 6895359 | Workpiece coordinate system origin setting method, workpiece coordinate system origin setting program and workpiece coordinate system origin setting device of a surface property measuring machine | Junji Sakurada, Toshiyuki Tamai | 2005-05-17 |
| 6546640 | Traverse linearity compensation method and rotational accuracy compensation method of measuring device | Eiji Okada, Yoshiyuki Omori, Atsushi Tsuruta | 2003-04-15 |
| 5694339 | Roundness measuring apparatus | Takao Ishitoya, Yoshiyuki Omori | 1997-12-02 |