| 9472855 |
Antenna device |
Hiroshi Toyao |
2016-10-18 |
| 9456499 |
Structural body and interconnect substrate |
Hiroshi Toyao |
2016-09-27 |
| 9166300 |
Slot antenna |
— |
2015-10-20 |
| 8982003 |
Slot antenna, electronic apparatus, and method for manufacturing slot antenna |
— |
2015-03-17 |
| 8190086 |
Transmission method, interface circuit, semiconductor device, semiconductor package, semiconductor module and memory module |
Hideki Sasaki, Muneo Fukaishi |
2012-05-29 |
| 8144482 |
Circuit board device, wiring board interconnection method, and circuit board module device |
Junya Sato, Nobuhiro Mikami, Shinji Watanabe, Atsumasa Sawada, Nozomu Nishimura |
2012-03-27 |
| 7906846 |
Semiconductor device for implementing signal transmission and/or power supply by means of the induction of a coil |
Shigeki Hoshino, Michinobu Tanioka |
2011-03-15 |
| 7852101 |
Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatus |
Michinobu Tanioka, Shigeki Hoshino |
2010-12-14 |
| 6486688 |
Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics |
Hirobumi Inoue, Michinobu Tanioka, Takahiro Kimura, Kouji Matsunaga |
2002-11-26 |
| 6400168 |
Method for fabricating probe tip portion composed by coaxial cable |
Kouji Matsunaga, Hirobumi Inoue, Masao Tanehashi, Masahiko Nikaidou, Yuuichi Yamagishi +1 more |
2002-06-04 |
| 6310483 |
Longitudinal type high frequency probe for narrow pitched electrodes |
Hirobumi Inoue, Masao Tanehashi, Kouji Matsunaga, Yuuichi Yamagishi, Satoshi Hayakawa +1 more |
2001-10-30 |
| 6281691 |
Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable |
Kouji Matsunaga, Hirobumi Inoue, Masao Tanehashi, Masahiko Nikaidou, Yuuichi Yamagishi +1 more |
2001-08-28 |
| 6242930 |
High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable |
Kouji Matsunaga, Hirobumi Inoue, Masao Tanehashi, Masahiko Nikaidou, Yuuichi Yamagishi +2 more |
2001-06-05 |
| 6229321 |
Process for manufacturing high frequency multichip module enabling independent test of bare chip |
Kouji Matsunaga, Hirobumi Inoue, Masao Tanehashi, Masahiko Nikaidou, Yuuichi Yamagishi +1 more |
2001-05-08 |
| 5614944 |
Test method and apparatus of sequentially executing synchronous signal test, dot level test, and gradation test of a video signal generator |
Hirobumi Inoue |
1997-03-25 |