Issued Patents All Time
Showing 1–25 of 118 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8933716 | Test apparatus and testing method | Masahiro Ishida, Kazuhiro Yamamoto | 2015-01-13 |
| 8896332 | Test apparatus with voltage margin test | Masahiro Ishida, Daisuke Watanabe, Kiyotaka Ichiyama | 2014-11-25 |
| 8892381 | Test apparatus and manufacturing method | Daisuke Watanabe | 2014-11-18 |
| 8754631 | Test apparatus for digital modulated signal | Daisuke Watanabe | 2014-06-17 |
| 8614465 | Electronic device and manufacturing method | Daisuke Watanabe | 2013-12-24 |
| 8610449 | Wafer unit for testing and test system | Daisuke Watanabe | 2013-12-17 |
| 8593166 | Semiconductor wafer, semiconductor circuit, substrate for testing and test system | Daisuke Watanabe | 2013-11-26 |
| 8554514 | Test apparatus and test method | Kazuhiro Yamamoto | 2013-10-08 |
| 8537935 | Clock data recovery circuit and method | Daisuke Watanabe | 2013-09-17 |
| 8502549 | Test apparatus and driver circuit | Shoji Kojima | 2013-08-06 |
| 8471754 | Time measurement circuit | Kazuhiro Yamamoto | 2013-06-25 |
| 8473248 | Test apparatus and test method | Kazuhiro Yamamoto | 2013-06-25 |
| 8466702 | Test system and substrate unit for testing | Daisuke Watanabe | 2013-06-18 |
| 8466701 | Power supply stabilizing circuit, electronic device and test apparatus | Shoji Kojima | 2013-06-18 |
| 8456170 | Test apparatus for digital modulated signal | Daisuke Watanabe | 2013-06-04 |
| 8436604 | Measuring apparatus, parallel measuring apparatus, testing apparatus and electronic device | Kazuhiro Yamamoto | 2013-05-07 |
| 8392145 | Timing generator | Daisuke Watanabe | 2013-03-05 |
| 8390268 | Noise measurement apparatus and test apparatus | — | 2013-03-05 |
| 8378700 | Wafer unit for testing semiconductor chips and test system | Daisuke Watanabe | 2013-02-19 |
| 8375340 | Apparatus for manufacturing substrate for testing, method for manufacturing substrate for testing and recording medium | Daisuke Watanabe, Masakatsu Suda | 2013-02-12 |
| 8369126 | Memory device, manufacturing method for memory device and method for data writing | Daisuke Watanabe | 2013-02-05 |
| 8362544 | Switching device and testing apparatus | — | 2013-01-29 |
| 8299810 | Test apparatus and electronic device | Daisuke Watanabe | 2012-10-30 |
| 8301411 | Electronic device, host apparatus, communication system, and recording medium | — | 2012-10-30 |
| 8278961 | Test apparatus and test method | Daisuke Watanabe | 2012-10-02 |