Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12301990 | Deep learning model for auto-focusing microscope systems | Denis Sharoukhov, Jonathan Lee | 2025-05-13 |
| 12205360 | Defect detection system | Denis Babeshko, Vadim Pinskiy, Matthew C. Putman, Andrew Sundstrom | 2025-01-21 |
| 12140744 | Autofocus system and method | Patrick Schmidt, Denis Sharoukhov, Jonathan Lee | 2024-11-12 |
| 12008737 | Deep learning model for noise reduction in low SNR imaging conditions | Denis Sharoukhov, Jonathan Lee | 2024-06-11 |
| 11574413 | Deep photometric learning (DPL) systems, apparatus and methods | Matthew C. Putman, Vadim Pinskiy, Tanaporn Na Narong, Denis Sharoukhov | 2023-02-07 |
| 11416711 | Defect detection system | Denis Babeshko, Vadim Pinskiy, Matthew C. Putman, Andrew Sundstrom | 2022-08-16 |
| 9141113 | Probabilistic surface characterization for safe landing hazard detection and avoidance (HDA) | Andres David Huertas, Andrew Johnson | 2015-09-22 |