Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7435642 | Method of evaluating the uniformity of the thickness of the polysilicon gate layer | Yuan-Chen Tsai, Shih-Jan Tung, Matsuo Hiroshi | 2008-10-14 |
| 6913516 | Dummy process and polishing-pad conditioning process for chemical mechanical polishing apparatus | Chi-Hao Chuang, Cheng-Hsiang Wu | 2005-07-05 |