Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7435642 | Method of evaluating the uniformity of the thickness of the polysilicon gate layer | Ta-Jen Wang, Yuan-Chen Tsai, Shih-Jan Tung | 2008-10-14 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7435642 | Method of evaluating the uniformity of the thickness of the polysilicon gate layer | Ta-Jen Wang, Yuan-Chen Tsai, Shih-Jan Tung | 2008-10-14 |