Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5580828 | Method for chemical surface passivation for in-situ bulk lifetime measurement of silicon semiconductor material | Gyorgy Ferenczi | 1996-12-03 |
| 5300200 | Method for stabilizing the effective dissolution valence of silicon during electrochemical depth profiling | — | 1994-04-05 |