Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347497 | NAND early erase termination based on leakage current test | Yuanyuan Wu, Xiaochen Zhu, Lito De La Rama, Heguang Li | 2025-07-01 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347497 | NAND early erase termination based on leakage current test | Yuanyuan Wu, Xiaochen Zhu, Lito De La Rama, Heguang Li | 2025-07-01 |