Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347497 | NAND early erase termination based on leakage current test | Yuanyuan Wu, Xiaochen Zhu, Lito De La Rama, Suanbin Loh | 2025-07-01 |
| 11694755 | Nonvolatile memory with data recovery | Hiroyuki Mizukoshi, Althaf Rahamathulla, Qihan Li | 2023-07-04 |