Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5266890 | Test wafer for diagnosing flaws in an integrated circuit fabrication process that cause A-C defects | Cevat Kumbasar, Jonathan Levi, Richard J. Petschauer, Roy R. Shanks | 1993-11-30 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5266890 | Test wafer for diagnosing flaws in an integrated circuit fabrication process that cause A-C defects | Cevat Kumbasar, Jonathan Levi, Richard J. Petschauer, Roy R. Shanks | 1993-11-30 |