Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5266890 | Test wafer for diagnosing flaws in an integrated circuit fabrication process that cause A-C defects | Jonathan Levi, Richard J. Petschauer, Roy R. Shanks, Steven S. Wei | 1993-11-30 |
| 5166660 | Random access compare array | LuVerne Ray Peterson | 1992-11-24 |
| 4897813 | Partially programmable read-only memory system | — | 1990-01-30 |