Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7342225 | Crystallographic metrology and process control | Erik Cho Houge, Brian Kempshall, Fred Stevie | 2008-03-11 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7342225 | Crystallographic metrology and process control | Erik Cho Houge, Brian Kempshall, Fred Stevie | 2008-03-11 |