Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6377901 | Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time | David T. Crook | 2002-04-23 |
| 6324486 | Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time | David T. Crook, Stephen P. Rozum, Eddie Williamson | 2001-11-27 |