Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10386310 | System for measuring levels of radiation reflecting from semiconductor material for use in measuring the dopant content thereof | — | 2019-08-20 |
| 8829442 | Non-contact measurement of the dopant content of semiconductor layers | E. Michael Heaven, Gordon Matthew Deans, Kenneth Cadien | 2014-09-09 |