SD

Shemesh Dror

IM Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh: 1 patents #32 of 73Top 45%
Overall (All Time): #3,261,308 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8008629 Charged particle beam device and method for inspecting specimen Pavel Adamec 2011-08-30