| 9423416 |
Scanning probe microscope and measuring method using same |
Akira Nambu, Tsuyoshi Yamamoto, Hideaki Koizumi, Tomihiro Hashizume |
2016-08-23 |
| 8912789 |
Magnetic force microscope and magnetic field observation method using same |
— |
2014-12-16 |
| 7799701 |
Method of coating substrate |
Tomihiro Hashizume, Masayoshi Ishibashi |
2010-09-21 |
| 7557662 |
Oscillator and frequency detector |
Tomihiro Hashizume |
2009-07-07 |
| 6670622 |
Electron exposure device and method and electronic characteristics evaluation device using scanning probe |
Masayoshi Ishibashi, Tomihiro Hashizume |
2003-12-30 |
| 6366340 |
Electron exposure apparatus |
Masayoshi Ishibashi, Tomihiro Hashizume, Yasuo Wada, Hiroshi Kajiyama |
2002-04-02 |
| 5801472 |
Micro-fabricated device with integrated electrostatic actuator |
Yasuo Wada, Munehisa Mitsuya, Tsuneo Ichiguchi, Tomihiro Hashizume, Mark Ian Lutwyche +1 more |
1998-09-01 |
| 5694059 |
Buffer of fine connection structure for connecting an atom level circuit and a general semiconductor circuit |
Yasuo Wada, Munehisa Mitsuya, Yasushi Tomioka, Mark Ian Lutwyche, Seiichi Kondo |
1997-12-02 |
| 5510614 |
Solid surface observation method and apparatus therefor, and electronic apparatus formed of the solid surface observation apparatus and method of forming the electronic apparatus |
Munehisa Mitsuya, Yasuo Wada, Seiichi Kondo |
1996-04-23 |