Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8327205 | IC testing methods and apparatus | Tom Waayers, Johan C. Meirlevede, David Price, Norbert Schomann, Herve Fleury +1 more | 2012-12-04 |
| 6789219 | Arrangement and method of testing an integrated circuit | Friedrich Hapke, Andreas Glowatz | 2004-09-07 |