Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4646341 | Calibration standard for X-ray fluorescence thickness | Paul Finer, William Silverman | 1987-02-24 |
| 4343092 | Probe guide and holder | William D. Hay, Raymond J. Prohaska | 1982-08-10 |
| 4245189 | Probe assembly for measuring conductivity of plated through holes | Derek Lieber, Jay M. Lesser | 1981-01-13 |