Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5266890 | Test wafer for diagnosing flaws in an integrated circuit fabrication process that cause A-C defects | Cevat Kumbasar, Jonathan Levi, Richard J. Petschauer, Steven S. Wei | 1993-11-30 |
| 4329685 | Controlled selective disconnect system for wafer scale integrated circuits | Michael J. Mahon | 1982-05-11 |
| 4203123 | Thin film memory device employing amorphous semiconductor materials | — | 1980-05-13 |