RK

Robert G. Knollenberg

PS Particle Measuring Systems: 11 patents #4 of 64Top 7%
Overall (All Time): #474,037 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5493123 Surface defect inspection system and method Vaughn C. Hoxie, Clinton E. Utter 1996-02-20
5459569 Nonintrusive modular particle detecting device Scott C. Knollenberg 1995-10-17
5282151 Submicron diameter particle detection utilizing high density array 1994-01-25
4893928 Highly sensitive particle size detection device having noise cancellation 1990-01-16
4893932 Surface analysis system and method 1990-01-16
4798465 Particle size detection device having high sensitivity in high molecular scattering environment 1989-01-17
4740988 Laser device having mirror heating Ramin Lalezari, Kenneth R. Sample 1988-04-26
4728190 Device and method for optically detecting particles in a fluid 1988-03-01
4636075 Particle measurement utilizing orthogonally polarized components of a laser beam 1987-01-13
4594715 Laser with stabilized external passive cavity 1986-06-10
4571079 Aerosol sampling device and method with improved sample flow characteristics 1986-02-18