CU

Clinton E. Utter

PS Particle Measuring Systems: 1 patents #41 of 64Top 65%
Overall (All Time): #3,736,693 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5493123 Surface defect inspection system and method Robert G. Knollenberg, Vaughn C. Hoxie 1996-02-20