RH

Richard N. Hedden

Micron: 12 patents #1,275 of 6,345Top 25%
Overall (All Time): #409,307 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11276450 Refresh circuitry 2022-03-15
10304515 Refresh circuitry 2019-05-28
9741421 Refresh circuitry 2017-08-22
7294790 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Mark T. Van Horn, David R. Cuthbert, Aaron Schoenfeld 2007-11-13
7239152 Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Mark T. Van Horn, David R. Cuthbert, Aaron Schoenfeld 2007-07-03
7212013 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Mark T. Van Horn, David R. Cuthbert, Aaron Schoenfeld 2007-05-01
7208959 Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Mark T. Van Horn, David R. Cuthbert, Aaron Schoenfeld 2007-04-24
7208935 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Mark T. Van Horn, David R. Cuthbert, Aaron Schoenfeld 2007-04-24
7199593 Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Mark T. Van Horn, David R. Cuthbert, Aaron Schoenfeld 2007-04-03
7145323 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Mark T. Van Horn, David R. Cuthbert, Aaron Schoenfeld 2006-12-05
6822438 Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer Mark T. Van Horn, David R. Cuthbert, Aaron Schoenfeld 2004-11-23
6563299 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Mark T. Van Horn, David R. Cuthbert, Aaron Schoenfeld 2003-05-13