Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9588137 | Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-up | Wilfried Vandervorst, Ruping Cao, Andreas Schulze | 2017-03-07 |
| 6823723 | Method and apparatus for performing atomic force microscopy measurements | Wilfried Vandervorst | 2004-11-30 |