Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8532364 | Apparatus and method for detecting defects in wafer manufacturing | Alexander Urban, Andreas Pfeiffer, Holger Schwekendiek | 2013-09-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8532364 | Apparatus and method for detecting defects in wafer manufacturing | Alexander Urban, Andreas Pfeiffer, Holger Schwekendiek | 2013-09-10 |