Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11921433 | Optical metrology in machine learning to characterize features | Ye Feng, Yan Zhang | 2024-03-05 |
| 11181489 | Determining tilt angle in patterned arrays of high aspect-ratio structures by small-angle x-ray scattering | William Dean Thompson, Regis Joseph Kline, Daniel F. Sunday, Wenli Wu, Jin Zhang +1 more | 2021-11-23 |
| 10222337 | Laser ablation analysis techniques | Jong Hyun Yoo, Chunyi Liu, Alexander A. Bol'shakov, Richard E. Russo, Xianglei Mao +1 more | 2019-03-05 |