Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324128 | Method of testing semiconductor devices and system for testing semiconductor devices | — | 2019-06-18 |
| 5291127 | Chip-lifetime testing instrument for semiconductor devices | Khee Park, Jin H. Yoon, Gi Yeong JEON | 1994-03-01 |
| 5281759 | Semiconductor package | Jin H. Yoon | 1994-01-25 |