Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12384167 | Recording device | Yukiya BEPPU | 2025-08-12 |
| 12157355 | Guide rail | Tomohito Kiryu, Koichi Morita, Hideaki Kanasugi, Shunsuke Kanagai, Nobuo Hayama +1 more | 2024-12-03 |
| 12037833 | Slide door driving device | Satoshi Shibayama, Masato Mori, Shunsuke Kanagai, Hideaki Kanasugi, Nobuo Hayama +1 more | 2024-07-16 |
| 11685177 | Recording device | Yukiya BEPPU | 2023-06-27 |
| 11292260 | Liquid storing device and recording apparatus | Koki FUKASAWA | 2022-04-05 |
| 10928417 | Atomic force microscope, atomic force microscopy, and controlling method of an atomic force microscopy | — | 2021-02-23 |
| 10639887 | Printing apparatus | Takao Yamamoto, Akira Ishikawa, Yusuke Makishima, Daiki ISHIKAWA | 2020-05-05 |
| 10161959 | Atomic force microscope and control method of the same | — | 2018-12-25 |
| 10107833 | Atomic force microscope and control method of the same | — | 2018-10-23 |
| 9977049 | Scanning probe microscope and control method thereof | — | 2018-05-22 |
| 9968017 | Electromagnetic shielding tube | Masanori Yamasaki, Tatsuya Yuasa, Yoshiyuki Hirayama, Naoko Omori, Masakazu Kozawa +2 more | 2018-05-08 |
| 9625491 | Scanning mechanism and scanning probe microscope | Yoshitsugu UEKUSA | 2017-04-18 |
| 9519005 | Scanning mechanism and scanning probe microscope | — | 2016-12-13 |
| 9482690 | Scanning probe microscope | Yoshitsugu UEKUSA | 2016-11-01 |
| 9453856 | Scanning probe microscope and scanning probe microscopy | — | 2016-09-27 |
| 9347969 | Compound microscope | Yoshitsugu UEKUSA | 2016-05-24 |
| 9335341 | Scanning probe microscope and control method thereof | — | 2016-05-10 |
| 9170272 | Scanning mechanism and scanning probe microscope | — | 2015-10-27 |
| 7085030 | Optical scanner driving apparatus and optical scanner driving method | — | 2006-08-01 |
| 6980359 | Microscope system | Takashi Yoneyama | 2005-12-27 |
| 6775039 | Driving circuit for an optical scanner | — | 2004-08-10 |
| 6097197 | Scanning probe microscope | Katsuhiro Matsuyama, Seizo Morita, Yasuhiro Sugawara | 2000-08-01 |
| 5929643 | Scanning probe microscope for measuring the electrical properties of the surface of an electrically conductive sample | Katsuhiro Matsuyama | 1999-07-27 |
| 5543614 | Scanning probe microscope capable of suppressing probe vibration caused by feedback control | Hirofumi Miyamoto, Mitsugu Sakai, Mitsumori Hayashida | 1996-08-06 |
| 5386720 | Integrated AFM sensor | Akitoshi Toda, Michio Takayama, Katsuhiro Matsuyama, Yasushi Nakamura | 1995-02-07 |