Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10879449 | Semiconductor strain gauge and method of manufacturing same | — | 2020-12-29 |
| 8857247 | Probe for a scanning probe microscope and method of manufacture | Kevin Kjoller, Ami Chand | 2014-10-14 |
| 7370515 | Probes for use in scanning probe microscopes and methods of fabricating such probes | Ami Chand | 2008-05-13 |
| 7210330 | Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby | Ami Chand | 2007-05-01 |
| 7096711 | Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby | Ami Chand | 2006-08-29 |