| 12399796 |
Modular test system |
Matthew Borsini, Leland W. Thompson, Samuel Hudson, Robert Proulx |
2025-08-26 |
| 12249387 |
Multi-zone temperature testing system |
Robert Proulx, Samuel Hudson |
2025-03-11 |
| 12248381 |
Data retention event preparation/recovery system |
Robert Proulx |
2025-03-11 |
| 11842785 |
Temperature-accelerated solid-state storage testing methods |
Samuel Hudson, Robert Proulx |
2023-12-12 |
| 11734110 |
Storage device reclassification system |
Samuel Hudson, Robert Proulx, Erhan Aslan |
2023-08-22 |
| 11620058 |
Temperature-adjusted power-on data retention time tracking for solid state drives |
Frederick K. H. Lee, Girish Desai, Samuel Hudson, Robert Proulx, Leland W. Thompson |
2023-04-04 |
| 10095417 |
Method and system for improving flash storage read performance in partially programmed blocks |
Seungjune Jeon, Haleh Tabrizi, Alan R. Hanson, Andrew A. Cullen, III, Justin L. Ha +1 more |
2018-10-09 |