| 12399796 |
Modular test system |
Matthew Borsini, Leland W. Thompson, Michael Rijo, Samuel Hudson |
2025-08-26 |
| 12249387 |
Multi-zone temperature testing system |
Michael Rijo, Samuel Hudson |
2025-03-11 |
| 12248381 |
Data retention event preparation/recovery system |
Michael Rijo |
2025-03-11 |
| 12176921 |
Storage device syndrome-weight-based error correction system |
Yuanzheng Cai, Frederick K. H. Lee, Zhenwei WANG |
2024-12-24 |
| 12132499 |
Storage device syndrome-weight-based error correction system |
Frederick K. H. Lee, Yuanzheng Cai, Zhenwei WANG |
2024-10-29 |
| 11983422 |
PSLC-scan-based storage device initialization system |
Erhan Aslan, Samuel Hudson |
2024-05-14 |
| 11842785 |
Temperature-accelerated solid-state storage testing methods |
Samuel Hudson, Michael Rijo |
2023-12-12 |
| 11837306 |
Storage subsystem read voltage determination system |
Frederick K. H. Lee, Jie Wu |
2023-12-05 |
| 11734110 |
Storage device reclassification system |
Michael Rijo, Samuel Hudson, Erhan Aslan |
2023-08-22 |
| 11620058 |
Temperature-adjusted power-on data retention time tracking for solid state drives |
Frederick K. H. Lee, Girish Desai, Samuel Hudson, Michael Rijo, Leland W. Thompson |
2023-04-04 |