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Method for testing system-in-package devices |
James E. Hopkins, Herbert Tsai, Ching-Too Chen |
2009-06-09 |
| 7535214 |
Apparatus for testing system-in-package devices |
James E. Hopkins, Herbert Tsai, Ching-Too Chen |
2009-05-19 |
| 7518356 |
Apparatus for testing system-in-package devices |
James E. Hopkins, Herbert Tsai, Ching-Too Chen |
2009-04-14 |
| 7518357 |
Test circuits of an apparatus for testing micro SD devices |
James E. Hopkins, Herbert Tsai, Ching-Too Chen |
2009-04-14 |
| 7514914 |
Test circuits of an apparatus for testing system-in-package devices |
James E. Hopkins, Herbert Tsai, Ching-Too Chen |
2009-04-07 |
| 7489155 |
Method for testing plurality of system-in-package devices using plurality of test circuits |
James E. Hopkins, Herbert Tsai, Ching-Too Chen |
2009-02-10 |
| 7489156 |
Method for testing micro SD devices using test circuits |
James E. Hopkins, Herbert Tsai, Ching-Too Chen |
2009-02-10 |
| 7443190 |
Method for testing micro SD devices using each test circuits |
James E. Hopkins, Herbert Tsai, Ching-Too Chen |
2008-10-28 |
| 7388390 |
Method for testing electronic components |
Roger Brueckner, James E. Hopkins, Rudy Sterbenz |
2008-06-17 |
| 7262616 |
Apparatus, method and system for testing electronic components |
Roger Brueckner, James E. Hopkins, Rudolph J. Sterbenz |
2007-08-28 |