| 9638740 |
Test system with rotational test arms for testing semiconductor components |
Chien-Ming Chen, Chin-Yi Ou Yang |
2017-05-02 |
| 7545158 |
Method for testing system-in-package devices |
James E. Hopkins, Michael Peter Costello, Ching-Too Chen |
2009-06-09 |
| 7535214 |
Apparatus for testing system-in-package devices |
James E. Hopkins, Michael Peter Costello, Ching-Too Chen |
2009-05-19 |
| 7518356 |
Apparatus for testing system-in-package devices |
James E. Hopkins, Michael Peter Costello, Ching-Too Chen |
2009-04-14 |
| 7518357 |
Test circuits of an apparatus for testing micro SD devices |
James E. Hopkins, Michael Peter Costello, Ching-Too Chen |
2009-04-14 |
| 7514914 |
Test circuits of an apparatus for testing system-in-package devices |
James E. Hopkins, Michael Peter Costello, Ching-Too Chen |
2009-04-07 |
| 7489156 |
Method for testing micro SD devices using test circuits |
James E. Hopkins, Michael Peter Costello, Ching-Too Chen |
2009-02-10 |
| 7489155 |
Method for testing plurality of system-in-package devices using plurality of test circuits |
James E. Hopkins, Michael Peter Costello, Ching-Too Chen |
2009-02-10 |
| 7443190 |
Method for testing micro SD devices using each test circuits |
James E. Hopkins, Michael Peter Costello, Ching-Too Chen |
2008-10-28 |