Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7782064 | Test apparatus and test module | Junichi Matsumoto | 2010-08-24 |
| 7441166 | Testing apparatus and testing method | Kazuhiko Sato, Toshimi Ohsawa | 2008-10-21 |
| 6047393 | Memory testing apparatus | — | 2000-04-04 |
| 5764093 | Variable delay circuit | Yokichi Hayashi, Hiroshi Tsukahara, Katsumi Ochiai, Naoyoshi Watanabe | 1998-06-09 |
| 5495197 | Variable delay circuit | Yokichi Hayashi, Hiroshi Tsukahara, Katsumi Ochiai, Naoyoshi Watanabe | 1996-02-27 |