Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6437592 | Characterization of a semiconductor/dielectric interface by photocurrent measurements | Anna Paola Caricato, Daniele Caputo | 2002-08-20 |
| 6197606 | Determination of the thickness of a denuded zone in a silicon wafer | Marzio Brambilla, Francesco Cazzaniga, Giuseppe Pavia, Federica Zanderigo | 2001-03-06 |