Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10854421 | Charged particle beam system and method | Daniela Donhauser, Christian Mueller, Barry Chamley, Tobias Volkenandt, Dirk Preikszas +1 more | 2020-12-01 |
| 10763076 | Method for operating a particle beam generator for a particle beam device and particle beam device comprising a particle beam generator | — | 2020-09-01 |
| 10468229 | Method of generating a zoom sequence and microscope system configured to perform the method | — | 2019-11-05 |
| 10319560 | Method of determining crystallographic properties of a sample and electron beam microscope for performing the method | — | 2019-06-11 |
| 6197606 | Determination of the thickness of a denuded zone in a silicon wafer | Maria Luisa Polignano, Marzio Brambilla, Francesco Cazzaniga, Federica Zanderigo | 2001-03-06 |