MK

Masaaki Kano

Canon: 9 patents #6,722 of 19,416Top 35%
IL Isuzu Motors Limited: 3 patents #175 of 908Top 20%
JT Jtekt: 2 patents #749 of 1,969Top 40%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
TO Toshiba: 1 patents #1,121 of 2,688Top 45%
Overall (All Time): #290,948 of 4,157,543Top 7%
16
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11604170 Inspection device and inspection learning model generation device 2023-03-14
10812725 Display control apparatus and control method of the same Tomohiro Ota, Soushi Takita, Koichi Okada, Hidetaka Uemura, Satoshi Ishimaru 2020-10-20
10634621 Information processing method, information processing apparatus, and program Akiyoshi NAKASE 2020-04-28
10491828 Display control apparatus and control method of the same Tomohiro Ota, Soushi Takita, Koichi Okada, Hidetaka Uemura, Satoshi Ishimaru 2019-11-26
10469730 Imaging device and control method for simultaneously outputting an image pickup signal and a parallax image signal 2019-11-05
10021292 Image processing apparatus, image capturing apparatus and image processing program 2018-07-10
9774805 Image pickup apparatus changing gain of amplifier of image pickup device, control method therefor, and storage medium storing control program therefor 2017-09-26
9635289 Image capturing apparatus, control method thereof, and storage medium 2017-04-25
9161002 Image capture apparatus, control method, and recording medium related to Bayer structure 2015-10-13
8976276 Image processing apparatus, image capturing apparatus, and image processing method 2015-03-10
7982773 Imaging apparatus capable of capturing an image with reduced light falloff at edges and method for controlling the same 2011-07-19
5845723 Control device of a start-assist system Hideto Hirahara, Minori Higuchi, Haruyuki Hosoya 1998-12-08
5775448 Control device of a start-assist system Hideto Hirahara, Minori Higuchi, Haruyuki Hosoya 1998-07-07
5732787 Control device of a start-assist system Hideto Hirahara, Minori Higuchi, Haruyuki Hosoya 1998-03-31
4626101 Surface defect inspecting apparatus Shigeru Ogawa, Hiroshi Yamaji 1986-12-02
4567364 Method and apparatus for measuring dimension of secondary electron emission object Hiroshi Yamaji, Shinji Nakao, Katsuya Okumura 1986-01-28