Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10451653 | Controlling a per-pin measurement unit | Marc Spehlmann, John J. Keough | 2019-10-22 |
| 9959186 | Debugging in a semiconductor device test environment | John F. Rowe | 2018-05-01 |
| 9244126 | Automated test system with event detection capability | Ronald A. Sartschev, Edward J. Seng | 2016-01-26 |
| 6356129 | Low jitter phase-locked loop with duty-cycle control | David E. O'Brien, Timothy Sheen, Michael A. Mittelbrunn, Abdelkebir Sabil | 2002-03-12 |