MD

Mark Lawrence Delaney

MI Mitutoyo: 21 patents #27 of 721Top 4%
Overall (All Time): #205,967 of 4,157,543Top 5%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11756186 Workpiece inspection and defect detection system utilizing color channels 2023-09-12
10812701 High-speed tag lens assisted 3D metrology and extended depth-of-field imaging Vahan Senekerimyan, Joseph Andrew Summers, Scott Ellis Hemmings, Paul Gerard Gladnick, Bjorn Erik Bertil Jansson 2020-10-20
9961253 Autofocus system for a high speed periodically modulated variable focal length lens Robert Kamil Bryll 2018-05-01
9774765 Chromatic aberration correction in imaging system including variable focal length lens Robert Kamil Bryll 2017-09-26
9456120 Focus height repeatability improvement in a machine vision inspection system 2016-09-27
9350921 Structured illumination projection with enhanced exposure control Paul Gerard Gladnick 2016-05-24
9234852 Systems and methods for controlling strobe illumination Paul Gerard Gladnick 2016-01-12
9177222 Edge measurement video tool and interface including automatic parameter set alternatives Yuhua Ding, Robert Kamil Bryll, Michael Nahum 2015-11-03
9167215 Machine vision system editing environment for a part program in which a continuous stream of image acquisition operations are performed during a run mode Barry Saylor 2015-10-20
9080855 Method utilizing image correlation to determine position measurements in a machine vision system Michael Nahum 2015-07-14
8937654 Machine vision inspection system comprising two cameras having a rotational offset 2015-01-20
8902307 Machine vision system editing environment for a part program in which a continuous stream of image acquisition operations are performed during a run mode Barry Saylor 2014-12-02
8689127 Edge measurement video tool parameter-setting user interface Yuhua Ding, Michael Nahum 2014-04-01
8648906 Precision solder resist registration inspection method 2014-02-11
8534113 Optical aberration correction for machine vision inspection systems Robert Kamil Bryll 2013-09-17
8311311 Optical aberration correction for machine vision inspection systems Robert Kamil Bryll 2012-11-13
8280172 Edge location measurement correction for coaxial light images Shannon Roy Campbell 2012-10-02
8269830 Inspecting potentially interfering features in a machine vision system 2012-09-18
7590276 System and method for programming interrupting operations during moving image acquisition sequences in a vision system 2009-09-15
7499584 Smear-limit based system and method for controlling vision systems for consistently accurate and high-speed inspection 2009-03-03
7106300 Method for converting joystick deflection into motion in a computer vision system Barry Saylor, Rodney Doe 2006-09-12