Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8306787 | Method of evaluating precision of output data using error propagation | Kiyoshi Takamasu, Satoru Takahashi | 2012-11-06 |
| 7765079 | Two-dimensional lattice calibrating device, two-dimensional lattice calibrating method, two-dimensional lattice calibrating program and recording medium | Masayuki Nara | 2010-07-27 |
| 7599070 | Optical axis polarization type laser interferometer | Naoyuki Taketomi | 2009-10-06 |
| 7538888 | Method for estimating absolute distance of tracking laser interferometer and tracking laser interferometer | Shinichi Hara, Naoyuki Taketomi | 2009-05-26 |
| 7483807 | Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the program | Masayuki Nara | 2009-01-27 |
| 7408650 | Optical-axis deflection type laser interferometer, calibration method thereof, correcting method thereof, and measuring method thereof | Yasushi Ueshima, Naoyuki Taketomi | 2008-08-05 |
| 7225104 | Method and program for estimating uncertainty | Masayuki Nara | 2007-05-29 |
| 7188046 | Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the program | Masayuki Nara | 2007-03-06 |
| 6748790 | Method of calibrating measuring machines | — | 2004-06-15 |
| 6640607 | Method and apparatus for calibrating measuring machines | — | 2003-11-04 |